Collaborative Effort within the GATE MURI
- Kong & Dresselhaus
- MATERIAL GROWTH AND EDGES
- Crystallographic etching
- CVD graphene electrical characterization
- TEM & Raman characterization
- Edge and bulk annealing
- Yacoby
- TECHNOLOGY AND PHYSICS
- He-ion ultrahigh resolution patterning
- Characterization of graphene-oxide interface
- Quantum coherent devices
- Castro Neto
- SIMULATIONS
- Influence edge disorder
- Coulomb interactions in nanoribbon devices
- Disorder and mid-gap states in bilayer graphene
- Palacios
- DEVICES AND APPLICATIONS
- Graphene on different dielectrics
- Graphene detection on arbitrary substrate and transfer
techniques
- Design graphene devices using non-linear and bipolar characteristics
- Strano
- TECHNOLOGY AND DEVICES
- Chemical reactivity & functionalization of graphene
edges
- Graphene passivation
- Jarillo-Herrero
- TECHNOLOGY AND PHYSICS
- Ni crystallographic etching
- Bilayer devices and bandgap opening
- Bottom-up and Top-Down fabrication