Figure 1

Figure 1: Chip-bending apparatus to introduce uniaxial strain into III-V FETs. This setup allows repeatable electrical measurements with III-V chips stressed at various levels. In addition, Hall measurements can be conducted with a magnetic field applied.

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    Akintunde Akinwande Anantha Chandrakasan Brian Wardle Carlijn Mulder Carl Thompson Caroline Ross Charles Sodini Chih-Hao Chang CICS Clifton Fonstad Dana Weinstein Dimitri Antoniadis Duane Boning Eugene Fitzgerald Faraz Najafi Francesco Marsili George Barbastathis Hae-Seung Lee Harry Tuller Ichiro Masaki Jason Sussman Jeffrey Lang Jesus del Alamo Jing Kong Joel Dawson Joel Voldman Jongyoon Han Judy Hoyt Karen Gleason Karl Berggren Lan Wei Luca Daniel Luis Velásquez-García Marc Baldo Omar Mysore Philip Reusswig Rajeev Ram Sang-Gook Kim Sangeeta Bhatia Scott Manalis Sean Bishop Tomas Palacios Vitor Manfrinato Vladimir Bulovic Vladimir Stojanovic