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	<title>MTL Annual Research Report 2012 &#187; wentao wang</title>
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		<title>RF MEMS Resonators in 32-nm SOI CMOS Technology</title>
		<link>http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/</link>
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		<pubDate>Wed, 18 Jul 2012 22:25:53 +0000</pubDate>
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				<category><![CDATA[MEMS & BioMEMS]]></category>
		<category><![CDATA[dana weinstein]]></category>
		<category><![CDATA[radhika marathe]]></category>
		<category><![CDATA[wentao wang]]></category>

		<guid isPermaLink="false">http://www-mtl.mit.edu/wpmu/ar2012/?p=6140</guid>
		<description><![CDATA[This work presents the first hybrid RF MEMS-CMOS resonators demonstrated in silicon at the transistor level of IBM’s 32-nm SOI...]]></description>
				<content:encoded><![CDATA[<div class="page-restrict-output"><p>This work presents the first hybrid RF MEMS-CMOS resonators demonstrated in silicon at the transistor level of IBM’s 32-nm SOI CMOS process, without the need for any post-processing or packaging. The unreleased, Si bulk acoustic resonators are driven capacitively and sensed using a field effect transistor (FET). MEMS-CMOS Si resonators with acoustic Bragg reflectors (ABRs) are demonstrated at 11.1 GHz with <em>Q</em>~18 and a footprint of 5µm × 3µm.</p>
<p>The majority of electromechanical devices require a release step to freely suspend moving structures, which necessitate costly complex encapsulation methods and back-end-of-line (BEOL) processing of large-scale devices<sup> [<a href="http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/#footnote_0_6140" id="identifier_0_6140" class="footnote-link footnote-identifier-link" title="H. Xie, L. Erdmann, X. Zhu, K. Gabriel, and G. Fedder, &ldquo;Post-CMOS processing for high-aspect-ratio integrated silicon microstructures,&rdquo; Journal of Microelectromechanical Systems, vol. 11, no. 2, pp. 93-101, 2002.">1</a>] </sup>. Development of unreleased Si-based MEMS resonators in CMOS allows integration into front-end-of-line (FEOL) processing with no post-processing or packaging. We have previously demonstrated the Resonant Body Transistor (RBT), which employs active FET sensing of acoustic vibrations<sup> [<a href="http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/#footnote_1_6140" id="identifier_1_6140" class="footnote-link footnote-identifier-link" title="D. Weinstein and S. A. Bhave, &ldquo;The resonant body transistor,&rdquo; Nano Letters, vol. 10, no. 4, pp. 1234-37, 2010.">2</a>] </sup><sup> [<a href="http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/#footnote_2_6140" id="identifier_2_6140" class="footnote-link footnote-identifier-link" title="D. Weinstein and S. A. Bhave, &ldquo;Acoustic resonance in an independent-gate FinFET,&rdquo; in Solid State Sensor, Actuator and Microsystems Workshop(Hilton Head), 2010, pp. 459-462.">3</a>] </sup>, which amplifies the mechanical signal before parasitics. Realization of the RBT in CMOS technology leverages high <em>f<sub>T</sub></em>, high-performance transistors, enabling RF-MEMS resonators at frequencies orders of magnitude higher than possible with passive devices.</p>
<p>The hybrid MEMS-CMOS RBT presented in this work is a Si bulk-acoustic resonator with electrostatic drive formed using the gate dielectric and a body-contacted nFET sense transducer (see Figure 1). Acoustic vibrations in the unreleased resonator are confined using 7 pairs of 1D ABRs surrounding the device, which are patterned using shallow trench isolation (STI). The DC characteristics of the sense transistor are similar to standard body-contacted nFETs of the 32-nm SOI process and show no direct effect of the capacitor drive voltage on the FET behavior. The frequency response of an 11.1-GHz resonator is shown in Figure 2 for multiple bias conditions, verifying the mechanical nature of the resonance.</p>
<p>This first demonstration of an unreleased hybrid MEMS-CMOS resonator paves the way for monolithically integrated RF MEMS frequency sources and signal processors.</p>

<a href='http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/mtl-arr-2012-fig-1-2/' title='radhika_01.jpg'><img width="300" height="247" src="http://www-mtl.mit.edu/wpmu/ar2012/files/2012/07/MTL-ARR-2012-Fig-1-300x247.jpg" class="attachment-medium" alt="Figure 1" /></a>
<a href='http://www-mtl.mit.edu/wpmu/ar2012/rf-mems-resonators-in-32-nm-soi-cmos-technology/mtl-arr-2012-fig-2-2/' title='radhika_02.jpg'><img width="300" height="257" src="http://www-mtl.mit.edu/wpmu/ar2012/files/2012/07/MTL-ARR-2012-Fig-2-300x257.jpg" class="attachment-medium" alt="Figure 2" /></a>

<ol class="footnotes"><li id="footnote_0_6140" class="footnote">H. Xie, L. Erdmann, X. Zhu, K. Gabriel, and G. Fedder, &#8220;Post-CMOS processing for high-aspect-ratio integrated silicon microstructures,&#8221; <em>Journal of Microelectromechanical Systems</em>, vol. 11, no. 2, pp. 93-101, 2002.</li><li id="footnote_1_6140" class="footnote">D. Weinstein and S. A. Bhave, &#8220;The resonant body transistor,&#8221; <em>Nano Letters</em>, vol. 10, no. 4, pp. 1234-37, 2010.</li><li id="footnote_2_6140" class="footnote">D. Weinstein and S. A. Bhave, &#8220;Acoustic resonance in an independent-gate FinFET,&#8221; in <em>Solid State Sensor, Actuator and Microsystems Workshop(Hilton Head)</em>, 2010, pp. 459-462.</li></ol></div>]]></content:encoded>
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