Tomás Palacios' Group @ MIT

Advanced Semiconductor Materials and Devices

Editor’s Picks in Device Physics

The articles listed below are Editor’s Picks on research in device physics from Applied Physics Letters.
Abstract: We introduce an ac-transconductance method to profile the gate oxide traps in a HfO2 gated AlGaN/GaN Metal-Oxide-Semiconductor High-Electron-Mobility Transistors (MOS-HEMTs) that can exchange carriers with metal gates, which in turn causes changes in analog and pulsed channel currents. The method extracts energy and spacial distributions of the oxide and interface traps under the gate from the frequency dependence of ac transconductance. We demonstrate the method using MOS-HEMTs with gate oxides that were annealed at different temperatures.

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