RC-99. Waldron, N. S. and J. A. del Alamo, "Impact Ionization in Strained-Si/SiGe Heterostructures." 2003 IEEE International Electron Devices Meeting, Washington , DC , December 8-10, 2003 , pp. 813-816. (paper)
RC-93. Villanueva, A. A., J. A. del Alamo, T. Hisaka, and K. Hayashi, "Electrical Reliability of RF Power GaAs PHEMTs." 2003 IEEE International Electron Devices Meeting, Washington , DC , December 8-10, 2003 , pp. 719-722. (paper)
RC-97. Scholvin, J., J. G. Fiorenza, and J. A. del Alamo, "The Impact of Substrate Inversion on the Performance of RF Power LDMOSFETs on High-Resistivity SOI." 2003 IEEE International Electron Devices Meeting, Washington , DC , December 8-10, 2003 , pp. 363-366. (paper)
RC-96. Hisaka, T., Y. Nogami, A. Hasuike, H. Sasaki, N. Yoshida, K. Hayashi, T. Sonoda, A. Villanueva and J. A. del Alamo, "Degradation Mechanisms of PHEMTs under Large Signal Operation." 2003 IEEE GaAs IC Symposium, San Diego, CA, November 9-12, 2003, pp. 67-70. (paper)
NR-39. del Alamo, J. A. "Device Reliability: 'A Field Where it is Easy to Do Bad Research!'," 2003 GaAs Reliability Workshop, San Diego (CA), November 9, 2003.
RJ-98. Fiorenza, J. G., J. Scholvin, and J. A. del Alamo, "A Metal-Polysilicon Damascene Gate Technology for RF Power LDMOSFETs". IEEE Electron Device Letters, 24 (11), 698-700, November 2003. (paper)
NR-37. del Alamo, J. A. "Online Laboratories in Engineering Education: Technology, Pedagogy, Opportunities and Barriers," UNESCO International Forum on Integration of Science and Education in XXI Century", Saint Petersburg , Russia , September 7-11, 2003..
NR-40. Jaeger, R., J. A. del Alamo, M. Fukuta, H. S. Bennett, and C. M. Snowden, "Guest editorial: Special section on compound semiconductor microelectronics manufacturing: The future is here." IEEE Transactions on Semiconductor Manufacturing, vol. 16, no. 3, pp. 354-356, August 2003.
RC-95. del Alamo, J. A., V. Chang, J. Hardison, D. Zych and L. Hui, "An Online Microelectronics Device Characterization Laboratory with a Circuit-like User Interface." International Conference on Engineering Education 2002, Valencia (Spain), July 2003. (paper)
RC-94. Mertens, S. D., J. A. del Alamo, T. Suemitsu, and T. Enoki, "Hydrogen Sensitivity of InP HEMTs with a thick Ti-layer in the Ti/Pt/Au Gate Stack." 2003 InP and Related Materials Conference, Santa Barbara , CA , May 2003, pp. 223-226. (paper)
NR-36. del Alamo, J. A. "A Window into the Classroom: Online Laboratories," Centennial Celebration of EECS, MIT, May 24, 2003.
NR-34. del Alamo, J. A. "The MIT Microelectronics WebLab: an Online Microelectronics Device Characterization Laboratory," LINC Workshop, MIT, February 6, 2003.
RC-98. Villanueva, A. A., J. A. del Alamo, T. Hisaka, and K. Hayashi, " Electrical Reliability of RF Power GaAs PHEMTs". 5th Topical Workshop on Heterostructure Microelectronics, TWHM 2003, Okinawa (Japan), January 21-24, 2003 , pp. 42-43 (paper)