How Much Derating will be Required for Reliable GaN HEMT Operation?

MTL Seminar Series
Joe McPherson, Texas Instruments

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Joe McPherson received a Ph.D. in Physics from Florida State University. He is an IEEE Fellow and a Texas Instruments Senior Fellow Emeritus. Dr. McPherson has published over 200 papers on semiconductor reliability, authored the Reliability Chapters for 4 Books, and holds 20 Patents. Most recently, he authored a reliability textbook: Reliability Physics and Engineering, Springer Publishing, 2010 (2nd Ed. 2013).