[labnetwork] seeking X-ray reflectometry capability

[Morrison, Richard H., Jr.]

Hi Fred,

Draper has a Fisherscope XDV-u  XRF tool, our spot size can go down to 30um.  We have the ability for outside work to be done in our fab, if you are interested contact me.

Rick

Draper
Principal  Member of the Technical Staff
555 Technology Square
Cambridge Ma, 02139-3563

www.draper.com
rmorrison at draper.com
W 617-258-3420
C 508-930-3461



From: labnetwork-bounces at mtl.mit.edu [mailto:labnetwork-bounces at mtl.mit.edu] On Behalf Of Fred Newman
Sent: Wednesday, June 22, 2016 4:02 PM
To: labnetwork at mtl.mit.edu
Subject: [labnetwork] seeking X-ray reflectometry capability

Dear Colleagues,

I am looking for an X-ray reflectometry (XRR) capability for the characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces.  By any chance does anyone on this mailing list have access to such a measurement technique, or a use a laboratory that performs these measurements?

Many thanks!
Fred


--
Fred Newman
Research Engineer
Washington Nanofabrication Facility (WNF)
University of Washington
Fluke Hall 132, Box 352143
office 206 616 3534
mobile 505 450 4447
fnewman at uw.edu<mailto:fnewman at uw.edu>
https://www.wnf.washington.edu/
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