[labnetwork] Standards for XPS

[Elhadj M. Diallo]

Dear Deepalakshmi,

1) For your 1st question, I could say try to use a Ta2O5 thin layer with a known thickness for your depth profiling

2) For the XPS mode spectral reference you can use, Ag, Au, Cu, PET;
For UPS spectral reference you can use Ag, Au
For Profiling use a thin layer of Ta2O5
For mapping use an Au grid
I hope this will help you…
Thanks,

Marwane

KAUST, KSA

On Mar 29, 2018, at 3:19 PM, Deepalakshmi Putchen Dakshinamoorthy <pddeepa at iisc.ac.in<mailto:pddeepa at iisc.ac.in>> wrote:

Dear all,

We have Ultra Axis XPS and the standard we are using is Ag and Cu.

I would like to know what is the best standard for depth profiling
How to check whether the tool is fine at different modes (XPS, UPX, depth profiling, mapping)

Apreciate your valuable inputs

Dr Deepalakshmi PD
Technology Manager
Micro and Nano Characterisation Facility (MNCF)
Room No. GF-12
Centre for Nano Science and Engineering (CeNSE)
Indian Institute of Science (IISc)
Bengaluru-560 012, INDIA
T:  +91 80 2293 3181 (Ext:130)
M: +91-9886106429<tel:+91%2075501%2084746>
E: pddeepa at iisc.ac.in<mailto:pddeepa at iisc.ac.in>
W: w<http://www.mncf.cense.iisc.ac.in/>ww.mncf.cense.iisc.ac.in<http://www.mncf.cense.iisc.ac.in/>
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