[labnetwork] seeking X-ray reflectometry capability

[J Provine]

This is available at Stanford and is available to outside users. The tool
is part of the Stanford nano shared facilities. If you would like more
information please let me know.
J

On Wednesday, June 22, 2016, Fred Newman <fnewman at uw.edu> wrote:

> Dear Colleagues,
>
> I am looking for an X-ray reflectometry (XRR) capability for the
> characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces.
> By any chance does anyone on this mailing list have access to such a
> measurement technique, or a use a laboratory that performs these
> measurements?
>
> Many thanks!
> Fred
>
>
> --
> Fred Newman
> Research Engineer
> Washington Nanofabrication Facility (WNF)
> University of Washington
> Fluke Hall 132, Box 352143
> office 206 616 3534
> mobile 505 450 4447
> fnewman at uw.edu <javascript:_e(%7B%7D,'cvml','fnewman at uw.edu');>
> https://www.wnf.washington.edu/
>
-------------- next part --------------
An HTML attachment was scrubbed...
URL: <https://mtl.mit.edu/pipermail/labnetwork/attachments/20160622/ad4dcfcd/attachment.html>