[labnetwork] seeking X-ray reflectometry capability

[Gupta, Su]

We have the capability and expertise at the MINT Center in Alabama, and my graduate student can do the work for you at the rate of $5 per hour.

Best regards,
Su Gupta
________________________________
From: labnetwork-bounces at mtl.mit.edu [labnetwork-bounces at mtl.mit.edu] on behalf of J Provine [jprovine at stanford.edu]
Sent: Wednesday, June 22, 2016 8:03 PM
To: Fred Newman
Cc: labnetwork at mtl.mit.edu
Subject: Re: [labnetwork] seeking X-ray reflectometry capability

This is available at Stanford and is available to outside users. The tool is part of the Stanford nano shared facilities. If you would like more information please let me know.
J

On Wednesday, June 22, 2016, Fred Newman <fnewman at uw.edu<mailto:fnewman at uw.edu>> wrote:
Dear Colleagues,

I am looking for an X-ray reflectometry (XRR) capability for the characterization of thin metallic films (<100 nm) on Si and SiO2 surfaces.  By any chance does anyone on this mailing list have access to such a measurement technique, or a use a laboratory that performs these measurements?

Many thanks!
Fred


--
Fred Newman
Research Engineer
Washington Nanofabrication Facility (WNF)
University of Washington
Fluke Hall 132, Box 352143
office 206 616 3534
mobile 505 450 4447
fnewman at uw.edu<UrlBlockedError.aspx>
https://www.wnf.washington.edu/
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